Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is a cutting-edge imaging technique that utilizes a focused beam of electrons to scan the surface of a sample, producing high-resolution images with exceptional detail. Unlike traditional optical microscopes, SEM can achieve much higher magnifications and provide in-depth information about surface structures, making it an invaluable tool across various fields such as materials science, life sciences, and geology.

With years of experience in the field of electron microscopy, our team of experts is dedicated to providing high-quality SEM services tailored to meet your specific needs. We have successfully collaborated with clients from various industries, including academia, pharmaceuticals, and manufacturing, delivering precise imaging and analysis that drive innovation and research.

Figure 1. UICC Asbestos Chrysotile 'A' standard.

Figure 2. Tremolite asbestos, Death Valley, California

How SEM Works?

SEM operates by directing a focused electron beam onto the surface of a sample, generating a variety of signals, including secondary electrons, backscattered electrons, and characteristic X-rays. These signals are captured by detectors and converted into images that reveal the surface morphology and composition of the sample.

Sample Preparation: Samples often require conductive treatment to prevent charge accumulation during electron beam exposure.
Electron Beam Scanning: The electron beam scans the sample surface, collecting signals point by point.
Image Generation: Signals are processed by a computer to generate high-resolution images.

Applications

Materials Science: Analyzing microstructures, defects, and compositions of metals, polymers, and composites.
Biology: Observing the ultrastructure of cells, tissues, and microorganisms for research and diagnostics.
Geology: Studying the surface features of minerals, rocks, and fossils to understand geological processes.
Nanotechnology: Characterizing the morphology, size, and distribution of nanomaterials for advanced applications.
Electronics: Inspecting semiconductor devices and circuit boards for quality control and failure analysis.

Advantages

High Resolution: SEM provides images with resolutions down to the nanometer scale, allowing for detailed analysis of surface features.
Depth of Field: The technique offers a greater depth of field compared to optical microscopy, enabling clear imaging of three-dimensional structures.
Elemental Analysis: SEM can be equipped with Energy Dispersive X-ray Spectroscopy (EDS) for elemental composition analysis, providing valuable insights into material properties.
Versatility: SEM can be applied to a wide range of materials, including metals, ceramics, polymers, and biological specimens.

Quotation and ordering

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